Merge branch 'ci/move_adc_runner_to_generic_v6.0' into 'release/v6.0'

ci(adc): move all ADC runners to generic (v6.0)

See merge request espressif/esp-idf!49793

components/esp_adc/test_apps/adc/main/test_common_adc.h

@@ -42,7 +42,7 @@ extern "C" {
 
 #elif CONFIG_IDF_TARGET_ESP32S2
 #define ADC_TEST_LOW_VAL         0
-#define ADC_TEST_LOW_THRESH      35
+#define ADC_TEST_LOW_THRESH      80
 
 #define ADC_TEST_HIGH_VAL        8191
 #define ADC_TEST_HIGH_VAL_DMA    4095
@@ -66,7 +66,7 @@ extern "C" {
 
 #elif CONFIG_IDF_TARGET_ESP32C2
 #define ADC_TEST_LOW_VAL         0
-#define ADC_TEST_LOW_THRESH      15
+#define ADC_TEST_LOW_THRESH      30
 
 #define ADC_TEST_HIGH_VAL        3400
 #define ADC_TEST_HIGH_THRESH     200

components/esp_adc/test_apps/adc/pytest_adc.py

@@ -1,11 +1,11 @@
-# SPDX-FileCopyrightText: 2021-2025 Espressif Systems (Shanghai) CO LTD
+# SPDX-FileCopyrightText: 2021-2026 Espressif Systems (Shanghai) CO LTD
 # SPDX-License-Identifier: CC0-1.0
 import pytest
 from pytest_embedded import Dut
 from pytest_embedded_idf.utils import idf_parametrize
 
 
-@pytest.mark.adc
+@pytest.mark.generic
 @pytest.mark.parametrize('config', ['iram_safe', 'release', 'pm_enable'], indirect=True)
 @idf_parametrize(
     'target',
@@ -17,7 +17,7 @@ def test_adc(dut: Dut) -> None:
 
 
 # No PM test, as C2 doesn't support ADC continuous mode
-@pytest.mark.adc
+@pytest.mark.generic
 @pytest.mark.xtal_26mhz
 @pytest.mark.parametrize(
     'config, baud',
@@ -34,7 +34,7 @@ def test_adc_esp32c2_xtal_26mhz(dut: Dut) -> None:
 
 # TODO: IDF-15005
 # P4 REV2 adc
-# @pytest.mark.adc
+# @pytest.mark.generic
 # @pytest.mark.esp32p4_rev1
 # @pytest.mark.parametrize('config', ['esp32p4_rev1'], indirect=True)
 # @idf_parametrize(

examples/peripherals/adc/continuous_read/pytest_adc_continuous.py

@@ -5,7 +5,7 @@ from pytest_embedded.dut import Dut
 from pytest_embedded_idf.utils import idf_parametrize
 
 
-@pytest.mark.adc
+@pytest.mark.generic
 @idf_parametrize(
     'target',
     ['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2', 'esp32c5', 'esp32p4', 'esp32c61'],

examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py

@@ -5,7 +5,7 @@ from pytest_embedded.dut import Dut
 from pytest_embedded_idf.utils import idf_parametrize
 
 
-@pytest.mark.adc
+@pytest.mark.generic
 @idf_parametrize(
     'target',
     ['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2', 'esp32c5', 'esp32p4', 'esp32c61'],
@@ -15,7 +15,7 @@ def test_adc_oneshot(dut: Dut) -> None:
     dut.expect(r'EXAMPLE: ADC1 Channel\[(\d+)\] Raw Data: (\d+)', timeout=5)
 
 
-@pytest.mark.adc
+@pytest.mark.generic
 @pytest.mark.xtal_26mhz
 @pytest.mark.parametrize(
     'config, baud',

examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py

@@ -5,7 +5,7 @@ from pytest_embedded import Dut
 from pytest_embedded_idf.utils import idf_parametrize
 
 
-@pytest.mark.adc
+@pytest.mark.generic
 @idf_parametrize('target', ['esp32'], indirect=['target'])
 def test_dac_cosine_wave_example_with_12bit_adc(dut: Dut) -> None:
     res = []
@@ -19,7 +19,7 @@ def test_dac_cosine_wave_example_with_12bit_adc(dut: Dut) -> None:
     assert max(chan0_val) - min(chan0_val) > 1000
 
 
-@pytest.mark.adc
+@pytest.mark.generic
 @idf_parametrize('target', ['esp32s2'], indirect=['target'])
 def test_dac_cosine_wave_example_with_13bit_adc(dut: Dut) -> None:
     res = []

pytest.ini

@@ -94,7 +94,6 @@ env_markers =
     flash_120m: runner with 120M supported Flash
     jtag: runner where the chip is accessible through JTAG as well
     usb_serial_jtag: runner where the chip is accessible through builtin JTAG as well
-    adc: ADC related tests should run on adc runners
     xtal32k: Runner with external 32k crystal connected
     no32kXtal: Runner with no external 32k crystal connected
     psramv0: Runner with PSRAM version 0