From 84c58612c08bf62cfc5aaafa0a52e19436596e06 Mon Sep 17 00:00:00 2001 From: gaoxu Date: Thu, 18 Jun 2026 09:45:09 +0800 Subject: [PATCH] ci(adc): remove ADC runner and move ADC tests to generic --- components/esp_adc/test_apps/adc/main/test_common_adc.h | 4 ++-- components/esp_adc/test_apps/adc/pytest_adc.py | 8 ++++---- .../adc/continuous_read/pytest_adc_continuous.py | 2 +- .../peripherals/adc/oneshot_read/pytest_adc_oneshot.py | 4 ++-- .../dac/dac_cosine_wave/pytest_dac_cosine_wave.py | 4 ++-- pytest.ini | 1 - 6 files changed, 11 insertions(+), 12 deletions(-) diff --git a/components/esp_adc/test_apps/adc/main/test_common_adc.h b/components/esp_adc/test_apps/adc/main/test_common_adc.h index f8f29eeee15..f544de49a4b 100644 --- a/components/esp_adc/test_apps/adc/main/test_common_adc.h +++ b/components/esp_adc/test_apps/adc/main/test_common_adc.h @@ -42,7 +42,7 @@ extern "C" { #elif CONFIG_IDF_TARGET_ESP32S2 #define ADC_TEST_LOW_VAL 0 -#define ADC_TEST_LOW_THRESH 35 +#define ADC_TEST_LOW_THRESH 80 #define ADC_TEST_HIGH_VAL 8191 #define ADC_TEST_HIGH_VAL_DMA 4095 @@ -66,7 +66,7 @@ extern "C" { #elif CONFIG_IDF_TARGET_ESP32C2 #define ADC_TEST_LOW_VAL 0 -#define ADC_TEST_LOW_THRESH 15 +#define ADC_TEST_LOW_THRESH 30 #define ADC_TEST_HIGH_VAL 3400 #define ADC_TEST_HIGH_THRESH 200 diff --git a/components/esp_adc/test_apps/adc/pytest_adc.py b/components/esp_adc/test_apps/adc/pytest_adc.py index 0d204a10a2b..0fa79317d92 100644 --- a/components/esp_adc/test_apps/adc/pytest_adc.py +++ b/components/esp_adc/test_apps/adc/pytest_adc.py @@ -1,11 +1,11 @@ -# SPDX-FileCopyrightText: 2021-2025 Espressif Systems (Shanghai) CO LTD +# SPDX-FileCopyrightText: 2021-2026 Espressif Systems (Shanghai) CO LTD # SPDX-License-Identifier: CC0-1.0 import pytest from pytest_embedded import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.parametrize('config', ['iram_safe', 'release', 'pm_enable'], indirect=True) @idf_parametrize( 'target', @@ -17,7 +17,7 @@ def test_adc(dut: Dut) -> None: # No PM test, as C2 doesn't support ADC continuous mode -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.xtal_26mhz @pytest.mark.parametrize( 'config, baud', @@ -34,7 +34,7 @@ def test_adc_esp32c2_xtal_26mhz(dut: Dut) -> None: # TODO: IDF-15005 # P4 REV2 adc -# @pytest.mark.adc +# @pytest.mark.generic # @pytest.mark.esp32p4_rev1 # @pytest.mark.parametrize('config', ['esp32p4_rev1'], indirect=True) # @idf_parametrize( diff --git a/examples/peripherals/adc/continuous_read/pytest_adc_continuous.py b/examples/peripherals/adc/continuous_read/pytest_adc_continuous.py index c7793c69a52..8645c0f4f04 100644 --- a/examples/peripherals/adc/continuous_read/pytest_adc_continuous.py +++ b/examples/peripherals/adc/continuous_read/pytest_adc_continuous.py @@ -5,7 +5,7 @@ from pytest_embedded.dut import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @idf_parametrize( 'target', ['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2', 'esp32c5', 'esp32p4', 'esp32c61'], diff --git a/examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py b/examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py index 17e15ba7277..24154a90e56 100644 --- a/examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py +++ b/examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py @@ -5,7 +5,7 @@ from pytest_embedded.dut import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @idf_parametrize( 'target', ['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2', 'esp32c5', 'esp32p4', 'esp32c61'], @@ -15,7 +15,7 @@ def test_adc_oneshot(dut: Dut) -> None: dut.expect(r'EXAMPLE: ADC1 Channel\[(\d+)\] Raw Data: (\d+)', timeout=5) -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.xtal_26mhz @pytest.mark.parametrize( 'config, baud', diff --git a/examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py b/examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py index 2e4ab8ce3f1..b1102bb62f0 100644 --- a/examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py +++ b/examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py @@ -5,7 +5,7 @@ from pytest_embedded import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @idf_parametrize('target', ['esp32'], indirect=['target']) def test_dac_cosine_wave_example_with_12bit_adc(dut: Dut) -> None: res = [] @@ -19,7 +19,7 @@ def test_dac_cosine_wave_example_with_12bit_adc(dut: Dut) -> None: assert max(chan0_val) - min(chan0_val) > 1000 -@pytest.mark.adc +@pytest.mark.generic @idf_parametrize('target', ['esp32s2'], indirect=['target']) def test_dac_cosine_wave_example_with_13bit_adc(dut: Dut) -> None: res = [] diff --git a/pytest.ini b/pytest.ini index 3a715b08347..a49e1f5b0db 100644 --- a/pytest.ini +++ b/pytest.ini @@ -94,7 +94,6 @@ env_markers = flash_120m: runner with 120M supported Flash jtag: runner where the chip is accessible through JTAG as well usb_serial_jtag: runner where the chip is accessible through builtin JTAG as well - adc: ADC related tests should run on adc runners xtal32k: Runner with external 32k crystal connected no32kXtal: Runner with no external 32k crystal connected psramv0: Runner with PSRAM version 0