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ci(adc): remove ADC runner and move ADC tests to generic

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This commit is contained in:
gaoxu
2026-06-18 09:45:09 +08:00
parent 839352f836
commit 84c58612c0
6 changed files with 11 additions and 12 deletions
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4
components/esp_adc/test_apps/adc/main/test_common_adc.h
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@@ -42,7 +42,7 @@ extern "C" {
#elif CONFIG_IDF_TARGET_ESP32S2
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 35
#define ADC_TEST_LOW_THRESH 80
#define ADC_TEST_HIGH_VAL 8191
#define ADC_TEST_HIGH_VAL_DMA 4095
@@ -66,7 +66,7 @@ extern "C" {
#elif CONFIG_IDF_TARGET_ESP32C2
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 15
#define ADC_TEST_LOW_THRESH 30
#define ADC_TEST_HIGH_VAL 3400
#define ADC_TEST_HIGH_THRESH 200

8
components/esp_adc/test_apps/adc/pytest_adc.py
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@@ -1,11 +1,11 @@
# SPDX-FileCopyrightText: 2021-2025 Espressif Systems (Shanghai) CO LTD
# SPDX-FileCopyrightText: 2021-2026 Espressif Systems (Shanghai) CO LTD
# SPDX-License-Identifier: CC0-1.0
import pytest
from pytest_embedded import Dut
from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.adc
@pytest.mark.generic
@pytest.mark.parametrize('config', ['iram_safe', 'release', 'pm_enable'], indirect=True)
@idf_parametrize(
'target',
@@ -17,7 +17,7 @@ def test_adc(dut: Dut) -> None:
# No PM test, as C2 doesn't support ADC continuous mode
@pytest.mark.adc
@pytest.mark.generic
@pytest.mark.xtal_26mhz
@pytest.mark.parametrize(
'config, baud',
@@ -34,7 +34,7 @@ def test_adc_esp32c2_xtal_26mhz(dut: Dut) -> None:
# TODO: IDF-15005
# P4 REV2 adc
# @pytest.mark.adc
# @pytest.mark.generic
# @pytest.mark.esp32p4_rev1
# @pytest.mark.parametrize('config', ['esp32p4_rev1'], indirect=True)
# @idf_parametrize(

2
examples/peripherals/adc/continuous_read/pytest_adc_continuous.py
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@@ -5,7 +5,7 @@ from pytest_embedded.dut import Dut
from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.adc
@pytest.mark.generic
@idf_parametrize(
'target',
['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2', 'esp32c5', 'esp32p4', 'esp32c61'],

4
examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py
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@@ -5,7 +5,7 @@ from pytest_embedded.dut import Dut
from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.adc
@pytest.mark.generic
@idf_parametrize(
'target',
['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2', 'esp32c5', 'esp32p4', 'esp32c61'],
@@ -15,7 +15,7 @@ def test_adc_oneshot(dut: Dut) -> None:
dut.expect(r'EXAMPLE: ADC1 Channel\[(\d+)\] Raw Data: (\d+)', timeout=5)
@pytest.mark.adc
@pytest.mark.generic
@pytest.mark.xtal_26mhz
@pytest.mark.parametrize(
'config, baud',

4
examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py
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@@ -5,7 +5,7 @@ from pytest_embedded import Dut
from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.adc
@pytest.mark.generic
@idf_parametrize('target', ['esp32'], indirect=['target'])
def test_dac_cosine_wave_example_with_12bit_adc(dut: Dut) -> None:
res = []
@@ -19,7 +19,7 @@ def test_dac_cosine_wave_example_with_12bit_adc(dut: Dut) -> None:
assert max(chan0_val) - min(chan0_val) > 1000
@pytest.mark.adc
@pytest.mark.generic
@idf_parametrize('target', ['esp32s2'], indirect=['target'])
def test_dac_cosine_wave_example_with_13bit_adc(dut: Dut) -> None:
res = []

1
pytest.ini
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@@ -94,7 +94,6 @@ env_markers =
flash_120m: runner with 120M supported Flash
jtag: runner where the chip is accessible through JTAG as well
usb_serial_jtag: runner where the chip is accessible through builtin JTAG as well
adc: ADC related tests should run on adc runners
xtal32k: Runner with external 32k crystal connected
no32kXtal: Runner with no external 32k crystal connected
psramv0: Runner with PSRAM version 0