ci(adc): remove ADC runner and move ADC tests to generic

This commit is contained in:
gaoxu
2026-06-25 16:54:15 +08:00
parent 68a5955756
commit 9bab3a823a
8 changed files with 14 additions and 15 deletions

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@@ -28,7 +28,7 @@
#elif CONFIG_IDF_TARGET_ESP32S2
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 35
#define ADC_TEST_LOW_THRESH 40
#define ADC_TEST_HIGH_VAL 8191
#define ADC_TEST_HIGH_THRESH 10
@@ -49,7 +49,7 @@
#elif CONFIG_IDF_TARGET_ESP32C2
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 15
#define ADC_TEST_LOW_THRESH 30
#define ADC_TEST_HIGH_VAL 3400
#define ADC_TEST_HIGH_THRESH 200

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@@ -5,7 +5,7 @@ from pytest_embedded import Dut
from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.adc
@pytest.mark.generic
@pytest.mark.parametrize(
'config',
[
@@ -20,7 +20,7 @@ def test_legacy_adc(dut: Dut) -> None:
dut.run_all_single_board_cases()
@pytest.mark.adc
@pytest.mark.generic
@pytest.mark.xtal_26mhz
@pytest.mark.parametrize(
'config, baud',

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@@ -42,7 +42,7 @@ extern "C" {
#elif CONFIG_IDF_TARGET_ESP32S2
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 35
#define ADC_TEST_LOW_THRESH 80
#define ADC_TEST_HIGH_VAL 8191
#define ADC_TEST_HIGH_VAL_DMA 4095
@@ -66,7 +66,7 @@ extern "C" {
#elif CONFIG_IDF_TARGET_ESP32C2
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 15
#define ADC_TEST_LOW_THRESH 30
#define ADC_TEST_HIGH_VAL 3400
#define ADC_TEST_HIGH_THRESH 200

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@@ -5,7 +5,7 @@ from pytest_embedded import Dut
from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.adc
@pytest.mark.generic
@pytest.mark.parametrize('config', ['iram_safe', 'release', 'pm_enable'], indirect=True)
@idf_parametrize(
'target', ['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2', 'esp32p4'], indirect=['target']
@@ -15,7 +15,7 @@ def test_adc(dut: Dut) -> None:
# No PM test, as C2 doesn't support ADC continuous mode
@pytest.mark.adc
@pytest.mark.generic
@pytest.mark.xtal_26mhz
@pytest.mark.parametrize(
'config, baud',
@@ -30,7 +30,7 @@ def test_adc_esp32c2_xtal_26mhz(dut: Dut) -> None:
dut.run_all_single_board_cases(timeout=120, reset=True)
@pytest.mark.adc
@pytest.mark.generic
@pytest.mark.parametrize(
'config',
[

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@@ -5,7 +5,7 @@ from pytest_embedded.dut import Dut
from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.adc
@pytest.mark.generic
@idf_parametrize('target', ['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2'], indirect=['target'])
def test_adc_continuous(dut: Dut) -> None:
res = dut.expect(r'TASK: ret is 0, ret_num is (\d+) bytes')

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@@ -5,13 +5,13 @@ from pytest_embedded.dut import Dut
from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.adc
@pytest.mark.generic
@idf_parametrize('target', ['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2'], indirect=['target'])
def test_adc_oneshot(dut: Dut) -> None:
dut.expect(r'EXAMPLE: ADC1 Channel\[(\d+)\] Raw Data: (\d+)', timeout=5)
@pytest.mark.adc
@pytest.mark.generic
@pytest.mark.xtal_26mhz
@pytest.mark.parametrize(
'config, baud',

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@@ -5,7 +5,7 @@ from pytest_embedded import Dut
from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.adc
@pytest.mark.generic
@idf_parametrize('target', ['esp32'], indirect=['target'])
def test_dac_cosine_wave_example_with_12bit_adc(dut: Dut) -> None:
res = []
@@ -19,7 +19,7 @@ def test_dac_cosine_wave_example_with_12bit_adc(dut: Dut) -> None:
assert max(chan0_val) - min(chan0_val) > 1000
@pytest.mark.adc
@pytest.mark.generic
@idf_parametrize('target', ['esp32s2'], indirect=['target'])
def test_dac_cosine_wave_example_with_13bit_adc(dut: Dut) -> None:
res = []

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@@ -93,7 +93,6 @@ ENV_MARKERS = {
'MSPI_F4R4': 'runner with Quad Flash and Quad PSRAM',
'jtag': 'runner where the chip is accessible through JTAG as well',
'usb_serial_jtag': 'runner where the chip is accessible through builtin JTAG as well',
'adc': 'ADC related tests should run on adc runners',
'xtal32k': 'Runner with external 32k crystal connected',
'no32kXtal': 'Runner with no external 32k crystal connected',
'psramv0': 'Runner with PSRAM version 0',