From 9bab3a823aef1db9757b2d2fb8065d9680302310 Mon Sep 17 00:00:00 2001 From: gaoxu Date: Thu, 25 Jun 2026 16:54:15 +0800 Subject: [PATCH] ci(adc): remove ADC runner and move ADC tests to generic --- .../test_apps/legacy_adc_driver/main/test_legacy_adc.c | 4 ++-- .../driver/test_apps/legacy_adc_driver/pytest_legacy_adc.py | 4 ++-- components/esp_adc/test_apps/adc/main/test_common_adc.h | 4 ++-- components/esp_adc/test_apps/adc/pytest_adc.py | 6 +++--- .../adc/continuous_read/pytest_adc_continuous.py | 2 +- examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py | 4 ++-- .../dac/dac_cosine_wave/pytest_dac_cosine_wave.py | 4 ++-- tools/ci/idf_pytest/constants.py | 1 - 8 files changed, 14 insertions(+), 15 deletions(-) diff --git a/components/driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c b/components/driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c index d53f34dc9d7..f9edc9e1720 100644 --- a/components/driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c +++ b/components/driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c @@ -28,7 +28,7 @@ #elif CONFIG_IDF_TARGET_ESP32S2 #define ADC_TEST_LOW_VAL 0 -#define ADC_TEST_LOW_THRESH 35 +#define ADC_TEST_LOW_THRESH 40 #define ADC_TEST_HIGH_VAL 8191 #define ADC_TEST_HIGH_THRESH 10 @@ -49,7 +49,7 @@ #elif CONFIG_IDF_TARGET_ESP32C2 #define ADC_TEST_LOW_VAL 0 -#define ADC_TEST_LOW_THRESH 15 +#define ADC_TEST_LOW_THRESH 30 #define ADC_TEST_HIGH_VAL 3400 #define ADC_TEST_HIGH_THRESH 200 diff --git a/components/driver/test_apps/legacy_adc_driver/pytest_legacy_adc.py b/components/driver/test_apps/legacy_adc_driver/pytest_legacy_adc.py index a42da15e950..31aac4c64ff 100644 --- a/components/driver/test_apps/legacy_adc_driver/pytest_legacy_adc.py +++ b/components/driver/test_apps/legacy_adc_driver/pytest_legacy_adc.py @@ -5,7 +5,7 @@ from pytest_embedded import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.parametrize( 'config', [ @@ -20,7 +20,7 @@ def test_legacy_adc(dut: Dut) -> None: dut.run_all_single_board_cases() -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.xtal_26mhz @pytest.mark.parametrize( 'config, baud', diff --git a/components/esp_adc/test_apps/adc/main/test_common_adc.h b/components/esp_adc/test_apps/adc/main/test_common_adc.h index cb5bfed30e3..acd83309019 100644 --- a/components/esp_adc/test_apps/adc/main/test_common_adc.h +++ b/components/esp_adc/test_apps/adc/main/test_common_adc.h @@ -42,7 +42,7 @@ extern "C" { #elif CONFIG_IDF_TARGET_ESP32S2 #define ADC_TEST_LOW_VAL 0 -#define ADC_TEST_LOW_THRESH 35 +#define ADC_TEST_LOW_THRESH 80 #define ADC_TEST_HIGH_VAL 8191 #define ADC_TEST_HIGH_VAL_DMA 4095 @@ -66,7 +66,7 @@ extern "C" { #elif CONFIG_IDF_TARGET_ESP32C2 #define ADC_TEST_LOW_VAL 0 -#define ADC_TEST_LOW_THRESH 15 +#define ADC_TEST_LOW_THRESH 30 #define ADC_TEST_HIGH_VAL 3400 #define ADC_TEST_HIGH_THRESH 200 diff --git a/components/esp_adc/test_apps/adc/pytest_adc.py b/components/esp_adc/test_apps/adc/pytest_adc.py index 5495a8d4084..0a4529ec46d 100644 --- a/components/esp_adc/test_apps/adc/pytest_adc.py +++ b/components/esp_adc/test_apps/adc/pytest_adc.py @@ -5,7 +5,7 @@ from pytest_embedded import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.parametrize('config', ['iram_safe', 'release', 'pm_enable'], indirect=True) @idf_parametrize( 'target', ['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2', 'esp32p4'], indirect=['target'] @@ -15,7 +15,7 @@ def test_adc(dut: Dut) -> None: # No PM test, as C2 doesn't support ADC continuous mode -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.xtal_26mhz @pytest.mark.parametrize( 'config, baud', @@ -30,7 +30,7 @@ def test_adc_esp32c2_xtal_26mhz(dut: Dut) -> None: dut.run_all_single_board_cases(timeout=120, reset=True) -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.parametrize( 'config', [ diff --git a/examples/peripherals/adc/continuous_read/pytest_adc_continuous.py b/examples/peripherals/adc/continuous_read/pytest_adc_continuous.py index 8ceedf04042..588c6be6609 100644 --- a/examples/peripherals/adc/continuous_read/pytest_adc_continuous.py +++ b/examples/peripherals/adc/continuous_read/pytest_adc_continuous.py @@ -5,7 +5,7 @@ from pytest_embedded.dut import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @idf_parametrize('target', ['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2'], indirect=['target']) def test_adc_continuous(dut: Dut) -> None: res = dut.expect(r'TASK: ret is 0, ret_num is (\d+) bytes') diff --git a/examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py b/examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py index eb9ca82ad42..7ce5c878911 100644 --- a/examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py +++ b/examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py @@ -5,13 +5,13 @@ from pytest_embedded.dut import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @idf_parametrize('target', ['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2'], indirect=['target']) def test_adc_oneshot(dut: Dut) -> None: dut.expect(r'EXAMPLE: ADC1 Channel\[(\d+)\] Raw Data: (\d+)', timeout=5) -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.xtal_26mhz @pytest.mark.parametrize( 'config, baud', diff --git a/examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py b/examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py index 4684a350bf7..e25bf6ce485 100644 --- a/examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py +++ b/examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py @@ -5,7 +5,7 @@ from pytest_embedded import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @idf_parametrize('target', ['esp32'], indirect=['target']) def test_dac_cosine_wave_example_with_12bit_adc(dut: Dut) -> None: res = [] @@ -19,7 +19,7 @@ def test_dac_cosine_wave_example_with_12bit_adc(dut: Dut) -> None: assert max(chan0_val) - min(chan0_val) > 1000 -@pytest.mark.adc +@pytest.mark.generic @idf_parametrize('target', ['esp32s2'], indirect=['target']) def test_dac_cosine_wave_example_with_13bit_adc(dut: Dut) -> None: res = [] diff --git a/tools/ci/idf_pytest/constants.py b/tools/ci/idf_pytest/constants.py index 4f7d869f46b..a10dd8e3ad9 100644 --- a/tools/ci/idf_pytest/constants.py +++ b/tools/ci/idf_pytest/constants.py @@ -93,7 +93,6 @@ ENV_MARKERS = { 'MSPI_F4R4': 'runner with Quad Flash and Quad PSRAM', 'jtag': 'runner where the chip is accessible through JTAG as well', 'usb_serial_jtag': 'runner where the chip is accessible through builtin JTAG as well', - 'adc': 'ADC related tests should run on adc runners', 'xtal32k': 'Runner with external 32k crystal connected', 'no32kXtal': 'Runner with no external 32k crystal connected', 'psramv0': 'Runner with PSRAM version 0',