Replace the virtual efuse flash-encryption flow in parlio, rmt, and lcd
test apps with real-device flash_enc configs so CI can validate the same
path used on encryption runners.
These tests enable features they do not use -- the VFS console, Wi-Fi task core pinning, and
the DS peripheral -- which shift memory layout, interrupt allocation, and peripheral access
enough to fail them. Override the unused options in each test's sdkconfig and ignore the
resulting unknown-symbol build warnings.
Add async color convert coverage for direct RGB24/BGR24 byte-order swaps
and
thread both TX and RX CSC state through DMA2D transactions for future
extensibility.
- Add intr_priority field to gdma_channel_t structure
- Add intr_bind_name field to gdma_signal_conn_t for interrupt binding
- Validate intr_priority during channel allocation (must be 0-3)
- Use ESP_INTR_FLAG_SHARED_PRIVATE instead of ESP_INTR_FLAG_SHARED
- Use esp_intr_alloc_info() with bind_by.name for shared interrupts
- Add interrupt priority configuration test case
- Update all gdma_periph.c files with pair-specific bind names (gdma_gXpY)
Replace *common_components with specific driver dependencies across all
peripheral driver test apps and examples to prevent unnecessary CI
triggers
when common_components change.
This follows the same pattern established in TWAI driver commit:
6d21cc6c29
Changes made:
- 26 component test apps updated
(esp_driver_*/test_apps/.build-test-rules.yml)
- 1 driver test app updated
(components/driver/test_apps/.build-test-rules.yml)
- Key examples updated in examples/peripherals/.build-test-rules.yml
- Established standard dependency pattern: esp_hal_xxx, esp_hw_support,
soc
- Added esp_driver_gpio for GPIO-dependent drivers