fix(uart): improve uart rx glitch filter test case failing rate

Not all IO glitch simulation functions were in iram before,
making the glitch too long to be filtered.

components/esp_hal_gpio/esp32c6/include/hal/gpio_ll.h

@@ -493,6 +493,7 @@ static inline int gpio_ll_get_in_signal_connected_io(gpio_dev_t *hw, uint32_t in
   * @param ctrl_by_periph True if use output enable signal from peripheral, false if force the output enable signal to be sourced from bit n of GPIO_ENABLE_REG
   * @param oen_inv True if the output enable needs to be inverted, otherwise False.
   */
+__attribute__((always_inline))
 static inline void gpio_ll_set_output_enable_ctrl(gpio_dev_t *hw, uint8_t gpio_num, bool ctrl_by_periph, bool oen_inv)
 {
     hw->func_out_sel_cfg[gpio_num].oen_inv_sel = oen_inv;       // control valid only when using gpio matrix to route signal to the IO