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Merge branch 'bugfix/rtc_wdt_test_app' into 'master'
fix(test_rtc_wdt): Fixed CI test failures for RTC WDT by increasing margin Closes IDFCI-4816, IDFCI-4835, IDFCI-5863, IDFCI-4799, and IDFCI-4817 See merge request espressif/esp-idf!42959
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@@ -22,7 +22,7 @@
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* the timing accuracy is not very precise, and may vary from chip to chip.
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* So, using some margin for the timeout checks.
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*/
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#define WDT_TIMEOUT_MARGIN_MS(X) (X * 20 / 100) // 20% margin
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#define WDT_TIMEOUT_MARGIN_MS(X) (X * 30 / 100) // 30% margin
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static const uint32_t wdt_stage_timeout_ms[] = {
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100, // Stage-0 timeout in ms
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@@ -113,7 +113,7 @@ TEST_CASE("RTC WDT triggers interrupt at expected time for all stages", "[rtc_wd
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/* Mark the start time afresh for each stage */
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wdt_start_time[stage] = esp_timer_get_time();
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wdt_int_triggered = false;
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wait_for_interrupt(wdt_stage_timeout_ms[stage] * 2); // Wait for twice the stage timeout
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wait_for_interrupt(wdt_stage_timeout_ms[stage] * 3); // Wait for three times the stage timeout at max
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printf("Stage-%d interrupt received for RTC WDT\n", stage);
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TEST_ASSERT_TRUE_MESSAGE(wdt_int_triggered, "RTC WDT interrupt did not trigger!");
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}
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