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ci(i2c): ignore known failure test case for legacy i2c driver

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This commit is contained in:
Chen Chen
2026-03-09 10:13:38 +08:00
committed by laokaiyao
parent 50416e2161
commit 41029ef278
1 changed files with 2 additions and 0 deletions
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2
components/driver/test_apps/i2c_test_apps/main/test_i2c_multi.c
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@@ -224,6 +224,7 @@ static void i2c_slave_read_test_large_write_small_read(void)
TEST_ESP_OK(i2c_del_slave_device(slave_handle));
}
// Ignored because the slave driver v1 API (`i2c_slave_receive`) is mis-designed. Redesigned in v5.4.
TEST_CASE_MULTIPLE_DEVICES("I2C master write slave test (large write small read)", "[i2c][ignore][test_env=generic_multi_device][timeout=150]", i2c_master_write_test_large_write_small_read, i2c_slave_read_test_large_write_small_read);
#endif
@@ -790,6 +791,7 @@ static void uart_test_i2c_master_freq(void)
}
}
// This test fails on v5.3 due to the I2C legacy driver bug. Fixed since v5.4.
TEST_CASE_MULTIPLE_DEVICES("I2C master clock frequency test", "[i2c][ignore][test_env=generic_multi_device][timeout=150]", uart_test_i2c_master_freq, i2c_master_write_fsm_reset);
#endif // CONFIG_IDF_TARGET_ESP32C3 || CONFIG_IDF_TARGET_ESP32S3