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esp-idf
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fe705586a57794de92a18a5bedef9bc19c78d17b
esp-idf
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components
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driver
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test_apps
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spi
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master
/
main
History
armando
84c6a7f596
test(system): increased 200B memory leak thresh due to mmu mmap mutex
...
200B to extend the thresh, real increase to the memory usage will be smaller
2025-07-08 10:07:17 +08:00
..
CMakeLists.txt
test: move spi related unit-test into pytest app
2022-11-10 16:02:03 +08:00
test_app_main.c
test(system): increased 200B memory leak thresh due to mmu mmap mutex
2025-07-08 10:07:17 +08:00
test_spi_bus_lock.c
esp32h4: checked all the corner stuffs of the removal
2023-04-26 18:53:12 +08:00
test_spi_master.c
esp_clk_tree: Rename clk_tree_xxx to esp_clk_tree_xxx, add compilation warning to clk_tree.h
2023-04-27 11:11:18 +00:00
test_spi_sio.c
ci: Disable some unit-test-apps for esp32c6 to pass ci build stage
2022-11-28 11:58:30 +08:00