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These tests enable features they do not use -- the VFS console, Wi-Fi task core pinning, and the DS peripheral -- which shift memory layout, interrupt allocation, and peripheral access enough to fail them. Override the unused options in each test's sdkconfig and ignore the resulting unknown-symbol build warnings.
| Supported Targets | ESP32 | ESP32-C2 | ESP32-C3 | ESP32-C5 | ESP32-C6 | ESP32-C61 | ESP32-H2 | ESP32-H21 | ESP32-H4 | ESP32-P4 | ESP32-S2 | ESP32-S3 | ESP32-S31 |
|---|
Test for esp_intr_dump
This test app serves two purposes:
- Sanity-checking
esp_intr_dumpfunction. These tests run in QEMU and make sure thatesp_intr_dumpproduces expected output when e.g. a shared interrupt is allocated. - Making unintended changes to the default interrupt allocations more visible in MRs. The way this works is, the output of
esp_intr_dumpis compared to the expected output, for example expected_output/esp32.txt. If you change IDF startup code so that it allocates an additional interrupt, you will need to update the expected output file. MR reviewers will see the modification of the expected output file and will evaluate the impact of the change.
When adding support for a new chip target
- Build the test app for the new target, flash it to the board.
- Enter
intr_dumpcommand in the console. - Copy the output and save it in
expected_output/<target>.txt.