Files
esp-idf/tools/test_apps/system/esp_intr_dump
Sudeep Mohanty b3951f4013 fix(test_apps): override config defaults unused by these tests
These tests enable features they do not use -- the VFS console, Wi-Fi task core pinning, and
the DS peripheral -- which shift memory layout, interrupt allocation, and peripheral access
enough to fail them. Override the unused options in each test's sdkconfig and ignore the
resulting unknown-symbol build warnings.
2026-07-01 13:17:25 +02:00
..

Supported Targets ESP32 ESP32-C2 ESP32-C3 ESP32-C5 ESP32-C6 ESP32-C61 ESP32-H2 ESP32-H21 ESP32-H4 ESP32-P4 ESP32-S2 ESP32-S3 ESP32-S31

Test for esp_intr_dump

This test app serves two purposes:

  1. Sanity-checking esp_intr_dump function. These tests run in QEMU and make sure that esp_intr_dump produces expected output when e.g. a shared interrupt is allocated.
  2. Making unintended changes to the default interrupt allocations more visible in MRs. The way this works is, the output of esp_intr_dump is compared to the expected output, for example expected_output/esp32.txt. If you change IDF startup code so that it allocates an additional interrupt, you will need to update the expected output file. MR reviewers will see the modification of the expected output file and will evaluate the impact of the change.

When adding support for a new chip target

  1. Build the test app for the new target, flash it to the board.
  2. Enter intr_dump command in the console.
  3. Copy the output and save it in expected_output/<target>.txt.