Sudeep Mohanty b8d99436a5 test(lp_core): extend LP UART multi-device test coverage ...

Refactor the LP UART multi-device tests to use a single parameterised
helper pair (test_lp_uart_write_cfg / test_lp_uart_read_cfg) instead of
one-off functions per config, and extend coverage to:

- write and read tests for 5-, 6-, 7-bit and even-parity configurations
- negative tests: word-length mismatch (FRAM_ERR recovery on LP side,
  garbled receive on HP side)
- LP GPIO Matrix routing tests (SOC_LP_GPIO_MATRIX_SUPPORTED chips only):
  swaps the default TX/RX GPIO numbers so both pins go through the LP GPIO
  Matrix, covering the lp_gpio_connect_in/out_signal() branch of
  lp_uart_config_io() that was previously untested at the data-transfer
  level; the same physical cross-wiring as all other LP UART tests is reused

Add rtc_gpio_deinit() cleanup at the end of single-board LP UART tests
so configured pins are returned to HP/digital mode and do not interfere
with subsequent tests that may reuse the same GPIOs.

2026-04-28 15:30:17 +02:00

..

lp_core

test(lp_core): extend LP UART multi-device test coverage

2026-04-28 15:30:17 +02:00

ulp_fsm

test: format all test scripts

2026-03-11 07:34:34 +01:00

ulp_riscv

test: format all test scripts

2026-03-11 07:34:34 +01:00

.build-test-rules.yml

feat(system): support choosing xtal as rtc-fast clock src on P4 and C5

2024-09-19 17:30:44 +08:00