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299480a5c0
Refactor the LP UART multi-device tests to use a single parameterised helper pair (test_lp_uart_write_cfg / test_lp_uart_read_cfg) instead of one-off functions per config, and extend coverage to: - write and read tests for 5-, 6-, 7-bit and even-parity configurations - negative tests: word-length mismatch (FRAM_ERR recovery on LP side, garbled receive on HP side) - LP GPIO Matrix routing tests (SOC_LP_GPIO_MATRIX_SUPPORTED chips only): swaps the default TX/RX GPIO numbers so both pins go through the LP GPIO Matrix, covering the lp_gpio_connect_in/out_signal() branch of lp_uart_config_io() that was previously untested at the data-transfer level; the same physical cross-wiring as all other LP UART tests is reused Add rtc_gpio_deinit() cleanup at the end of single-board LP UART tests so configured pins are returned to HP/digital mode and do not interfere with subsequent tests that may reuse the same GPIOs.