Replace the virtual efuse flash-encryption flow in parlio, rmt, and lcd
test apps with real-device flash_enc configs so CI can validate the same
path used on encryption runners.
Remove ~50 duplicate local definitions of ALIGN_UP/ALIGN_DOWN/ALIGN_UP_BY/
ALIGN_DOWN_BY across the codebase and replace them with canonical
ESP_ALIGN_UP/ESP_ALIGN_DOWN from esp_macros.h.
Replace *common_components with specific driver dependencies across all
peripheral driver test apps and examples to prevent unnecessary CI
triggers
when common_components change.
This follows the same pattern established in TWAI driver commit:
6d21cc6c29
Changes made:
- 26 component test apps updated
(esp_driver_*/test_apps/.build-test-rules.yml)
- 1 driver test app updated
(components/driver/test_apps/.build-test-rules.yml)
- Key examples updated in examples/peripherals/.build-test-rules.yml
- Established standard dependency pattern: esp_hal_xxx, esp_hw_support,
soc
- Added esp_driver_gpio for GPIO-dependent drivers
PPA SRM engine added YUV422 and GRAY8 color mode support
PPA SRM engine macro block size increased to 32x32
PPA Blending engine added YUV420, YUV422 and GRAY8 color mode support
Add burst_length option to client
Change uint32_t to color_pixel_rgb888_data_t
Descriptor always malloc with MALLOC_CAP_INTERNAL | MALLOC_CAP_8BIT
Add dscr-port mode block size configuration as a separate API in 2D-DMA driver
Do writeback only on an extended window, instead of entire picture
Remove the check for in_accepting_trans_state
Add color_pixel_xxxx_data_t structures to color_types.h
Fix PM lock protection (Tested, now works well)
* CPU_MAX, PM lock and semaphore order
* Remove ppa_driver PM lock
Modify concurrency (queue, trans recycle, semaphore, ...)
Add programming guide
Add test apps
