Reject LUT loads that exceed the hardware address space and assemble
each 32-bit LUT word via memcpy so unaligned and partial inputs do not
read past the caller buffer. Add regression tests for oversized and
partial unaligned LUT loads.
Clear the returned handle on loopback creation failure and route
initialized objects through bitscrambler_free so channel ownership and
extra cleanup state cannot leak after partial setup errors. Add a
regression test for the failed create path.
Replace *common_components with specific driver dependencies across all
peripheral driver test apps and examples to prevent unnecessary CI
triggers
when common_components change.
This follows the same pattern established in TWAI driver commit:
6d21cc6c29
Changes made:
- 26 component test apps updated
(esp_driver_*/test_apps/.build-test-rules.yml)
- 1 driver test app updated
(components/driver/test_apps/.build-test-rules.yml)
- Key examples updated in examples/peripherals/.build-test-rules.yml
- Established standard dependency pattern: esp_hal_xxx, esp_hw_support,
soc
- Added esp_driver_gpio for GPIO-dependent drivers
This adds an assembler for the BitScrambler assembly language,
plus unit tests for it. It also adds the loopback driver,
which can do BitScrambler operations on memory-to-memory
transfers. Documentation is also included.
