Refactor the LP UART multi-device tests to use a single parameterised
helper pair (test_lp_uart_write_cfg / test_lp_uart_read_cfg) instead of
one-off functions per config, and extend coverage to:
- write and read tests for 5-, 6-, 7-bit and even-parity configurations
- negative tests: word-length mismatch (FRAM_ERR recovery on LP side,
garbled receive on HP side)
- LP GPIO Matrix routing tests (SOC_LP_GPIO_MATRIX_SUPPORTED chips only):
swaps the default TX/RX GPIO numbers so both pins go through the LP GPIO
Matrix, covering the lp_gpio_connect_in/out_signal() branch of
lp_uart_config_io() that was previously untested at the data-transfer
level; the same physical cross-wiring as all other LP UART tests is reused
Add rtc_gpio_deinit() cleanup at the end of single-board LP UART tests
so configured pins are returned to HP/digital mode and do not interfere
with subsequent tests that may reuse the same GPIOs.
When ulp_lp_core_wakeup_main_processor() is called, it sets the
PMU_SW_INT_RAW bit on the HP side. The normal sleep path clears this
bit before re-entering sleep, but esp_wake_stub_sleep() did not, leaving
the wakeup cause sticky. This caused the PMU to immediately re-trigger a
wakeup as soon as sleep was requested from the wake stub, producing a
rapid re-wakeup loop that eventually triggered LP_WDT_SYS resets.
Add a test case that verifies the wake stub can return to sleep correctly
across multiple LP core wakeup cycles without the re-wakeup bug.
Closing https://github.com/espressif/esp-idf/issues/18308
Made-with: Cursor
This is a follow up commit on top of below commit:
c061c781a3
This commit further increases the ADC_TEST_LOW_VAL threshold from 2165
to 2200, because some tests were found to be failing with ADC reading
values such as 2171, 2172, 2182 etc. Suspecting the ADC callibration or
surrounding temperature to cause such fluctuations which need higher
threshold to avoid test failures.
The low power ADC in ESP32P4 sometimes reads the data value as 2160,
2161 or a bit greater than that when running the CI test case named
esp32p4.defaults.test_lp_core -> LP ADC 1 raw read stress test. However,
the test only passes if value stays below the LOW_VAL threshold of 2160.
Hence, updated the LOW_VAL threshold to 2165 keeping some margin,
because ADC readings may differ slightly from board to board, so this
type of small variations in ADC values are expected.
lp_core_i2c.h header file has sda and scl pins hardcoded to GPIO6 and
GPIO7 which works only for ESP32C6. ESP32C5 uses GPIO2 and GPIO3 for
I2C SDA and SCL. Hence, added LP_I2C_SCL_IO and LP_I2C_SDA_IO macros
under conditional compilation in library header file, so there is no
need to hardcode I2C GPIO pins and any other test apps or examples
that are including the LP I2C header file can also use Macro directly.
This commit:
- Removes the link time symbol name clash detection.
- Extracts symbols of type NOTYPE for global identifiers defined in
assembly files.
- Makes the prefix argument optional for ulp_add_build_binary_targets().
- Adds a unit test for the ulp binary embed with a prefix feature.
