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refactor(adc): move channel count to adc LL

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This commit is contained in:
morris
2026-08-25 12:30:52 +08:00
parent 5de7d85e4e
commit cd356d592d
40 changed files with 46 additions and 38 deletions
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components/esp_adc/test_apps/adc/main/test_adc_driver.c
+2 -1
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@@ -14,6 +14,7 @@
#include "esp_rom_sys.h"
#include "esp_adc/adc_oneshot.h"
#include "test_common_adc.h"
#include "hal/adc_ll.h"
#include "esp_adc/adc_continuous.h"
#include "esp_adc/adc_filter.h"
@@ -295,7 +296,7 @@ TEST_CASE("ADC continuous test after restarting", "[adc_continuous][ignore]")
for (int i = 0; i < ret_num; i += SOC_ADC_DIGI_RESULT_BYTES) {
adc_digi_output_data_t *p = (void*)&result[i];
uint32_t chan_num = ADC_DRIVER_TEST_GET_CHANNEL(p);
TEST_ASSERT(chan_num < SOC_ADC_CHANNEL_NUM(ADC_UNIT_1));
TEST_ASSERT(chan_num < ADC_LL_CHANNEL_NUM(ADC_UNIT_1));
}
TEST_ESP_OK(adc_continuous_stop(handle));
}
components/esp_adc/test_apps/adc/main/test_adc_tsens.c
+2 -1
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@@ -18,6 +18,7 @@
#include "esp_event.h"
#include "esp_wifi.h"
#include "test_common_adc.h"
#include "hal/adc_ll.h"
#include "test_utils.h"
#if SOC_TEMP_SENSOR_SUPPORTED && SOC_ADC_SUPPORTED
@@ -138,7 +139,7 @@ TEST_CASE("Test temperature sensor work with ADC continuous", "[adc]")
for (int i = 0; i < ret_num; i += SOC_ADC_DIGI_RESULT_BYTES) {
adc_digi_output_data_t *p = (void*)&result[i];
uint32_t chan_num = ADC_DRIVER_TEST_GET_CHANNEL(p);
TEST_ASSERT(chan_num < SOC_ADC_CHANNEL_NUM(ADC_UNIT_1));
TEST_ASSERT(chan_num < ADC_LL_CHANNEL_NUM(ADC_UNIT_1));
}
//Temperature sensor work after ADC continuous read
components/esp_adc/test_apps/adc/main/test_common_adc.c
+3 -3
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@@ -99,7 +99,7 @@ void test_adc_calibration_deinit(adc_cali_handle_t handle)
void test_adc_set_io_level(adc_unit_t unit, adc_channel_t channel, bool level)
{
TEST_ASSERT(channel < SOC_ADC_CHANNEL_NUM(unit) && "invalid channel");
TEST_ASSERT(channel < ADC_LL_CHANNEL_NUM(unit) && "invalid channel");
uint32_t io_num = ADC_GET_IO_NUM(unit, channel);
TEST_ESP_OK(gpio_set_pull_mode(io_num, (level ? GPIO_PULLUP_ONLY : GPIO_PULLDOWN_ONLY)));
@@ -118,7 +118,7 @@ void test_adc_set_io_level(adc_unit_t unit, adc_channel_t channel, bool level)
void test_adc_set_io_middle(adc_unit_t unit, adc_channel_t channel)
{
TEST_ASSERT(channel < SOC_ADC_CHANNEL_NUM(unit) && "invalid channel");
TEST_ASSERT(channel < ADC_LL_CHANNEL_NUM(unit) && "invalid channel");
uint32_t io_num = ADC_GET_IO_NUM(unit, channel);
TEST_ESP_OK(gpio_set_pull_mode(io_num, GPIO_PULLUP_PULLDOWN));
@@ -133,7 +133,7 @@ void test_adc_set_io_middle(adc_unit_t unit, adc_channel_t channel)
void test_assert_adc_raw(adc_unit_t unit, adc_channel_t channel, bool level, int raw, bool dma_mode, bool loose_thresh)
{
TEST_ASSERT(channel < SOC_ADC_CHANNEL_NUM(unit) && "invalid channel");
TEST_ASSERT(channel < ADC_LL_CHANNEL_NUM(unit) && "invalid channel");
#if defined ADC_TEST_HIGH_VAL_DMA
int expected_value = level ? (dma_mode ? ADC_TEST_HIGH_VAL_DMA : ADC_TEST_HIGH_VAL) : ADC_TEST_LOW_VAL;