From 80254568a6791171e0ba19cb551d32d3b5b29123 Mon Sep 17 00:00:00 2001 From: gaoxu Date: Tue, 23 Jun 2026 16:33:55 +0800 Subject: [PATCH] ci(adc): remove ADC runner and move ADC tests to generic --- .../driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c | 4 ++-- .../driver/test_apps/legacy_adc_driver/pytest_legacy_adc.py | 4 ++-- components/esp_adc/test_apps/adc/main/test_common_adc.h | 4 ++-- components/esp_adc/test_apps/adc/pytest_adc.py | 4 ++-- .../peripherals/adc/continuous_read/pytest_adc_continuous.py | 2 +- examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py | 4 ++-- .../peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py | 4 ++-- .../templates/known_generate_test_child_pipeline_warnings.yml | 2 -- tools/ci/idf_pytest/constants.py | 1 - 9 files changed, 13 insertions(+), 16 deletions(-) diff --git a/components/driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c b/components/driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c index bda4ba76ae5..8e46f32f733 100644 --- a/components/driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c +++ b/components/driver/test_apps/legacy_adc_driver/main/test_legacy_adc.c @@ -28,7 +28,7 @@ #elif CONFIG_IDF_TARGET_ESP32S2 #define ADC_TEST_LOW_VAL 0 -#define ADC_TEST_LOW_THRESH 35 +#define ADC_TEST_LOW_THRESH 40 #define ADC_TEST_HIGH_VAL 8191 #define ADC_TEST_HIGH_THRESH 10 @@ -49,7 +49,7 @@ #elif CONFIG_IDF_TARGET_ESP32C2 #define ADC_TEST_LOW_VAL 0 -#define ADC_TEST_LOW_THRESH 15 +#define ADC_TEST_LOW_THRESH 30 #define ADC_TEST_HIGH_VAL 3400 #define ADC_TEST_HIGH_THRESH 200 diff --git a/components/driver/test_apps/legacy_adc_driver/pytest_legacy_adc.py b/components/driver/test_apps/legacy_adc_driver/pytest_legacy_adc.py index 454a551a888..9396aa8ea68 100644 --- a/components/driver/test_apps/legacy_adc_driver/pytest_legacy_adc.py +++ b/components/driver/test_apps/legacy_adc_driver/pytest_legacy_adc.py @@ -5,7 +5,7 @@ from pytest_embedded import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.parametrize( 'config', [ @@ -22,7 +22,7 @@ def test_legacy_adc(dut: Dut) -> None: dut.run_all_single_board_cases() -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.xtal_26mhz @pytest.mark.parametrize( 'config, baud', diff --git a/components/esp_adc/test_apps/adc/main/test_common_adc.h b/components/esp_adc/test_apps/adc/main/test_common_adc.h index 812c357ac36..5b9cd197a8c 100644 --- a/components/esp_adc/test_apps/adc/main/test_common_adc.h +++ b/components/esp_adc/test_apps/adc/main/test_common_adc.h @@ -42,7 +42,7 @@ extern "C" { #elif CONFIG_IDF_TARGET_ESP32S2 #define ADC_TEST_LOW_VAL 0 -#define ADC_TEST_LOW_THRESH 35 +#define ADC_TEST_LOW_THRESH 80 #define ADC_TEST_HIGH_VAL 8191 #define ADC_TEST_HIGH_VAL_DMA 4095 @@ -66,7 +66,7 @@ extern "C" { #elif CONFIG_IDF_TARGET_ESP32C2 #define ADC_TEST_LOW_VAL 0 -#define ADC_TEST_LOW_THRESH 15 +#define ADC_TEST_LOW_THRESH 30 #define ADC_TEST_HIGH_VAL 3400 #define ADC_TEST_HIGH_THRESH 200 diff --git a/components/esp_adc/test_apps/adc/pytest_adc.py b/components/esp_adc/test_apps/adc/pytest_adc.py index 77d91d9fbca..6163c96ba1c 100644 --- a/components/esp_adc/test_apps/adc/pytest_adc.py +++ b/components/esp_adc/test_apps/adc/pytest_adc.py @@ -5,7 +5,7 @@ from pytest_embedded import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.parametrize('config', ['iram_safe', 'release', 'pm_enable'], indirect=True) @idf_parametrize( 'target', @@ -17,7 +17,7 @@ def test_adc(dut: Dut) -> None: # No PM test, as C2 doesn't support ADC continuous mode -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.xtal_26mhz @pytest.mark.parametrize( 'config, baud', diff --git a/examples/peripherals/adc/continuous_read/pytest_adc_continuous.py b/examples/peripherals/adc/continuous_read/pytest_adc_continuous.py index 1464273b15d..d5a0041fa60 100644 --- a/examples/peripherals/adc/continuous_read/pytest_adc_continuous.py +++ b/examples/peripherals/adc/continuous_read/pytest_adc_continuous.py @@ -5,7 +5,7 @@ from pytest_embedded.dut import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @idf_parametrize( 'target', ['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2', 'esp32c5'], indirect=['target'] ) diff --git a/examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py b/examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py index fdf95eed392..c67208b0286 100644 --- a/examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py +++ b/examples/peripherals/adc/oneshot_read/pytest_adc_oneshot.py @@ -5,7 +5,7 @@ from pytest_embedded.dut import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @idf_parametrize( 'target', ['esp32', 'esp32s2', 'esp32s3', 'esp32c3', 'esp32c6', 'esp32h2', 'esp32c5'], indirect=['target'] ) @@ -13,7 +13,7 @@ def test_adc_oneshot(dut: Dut) -> None: dut.expect(r'EXAMPLE: ADC1 Channel\[(\d+)\] Raw Data: (\d+)', timeout=5) -@pytest.mark.adc +@pytest.mark.generic @pytest.mark.xtal_26mhz @pytest.mark.parametrize( 'config, baud', diff --git a/examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py b/examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py index 4684a350bf7..e25bf6ce485 100644 --- a/examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py +++ b/examples/peripherals/dac/dac_cosine_wave/pytest_dac_cosine_wave.py @@ -5,7 +5,7 @@ from pytest_embedded import Dut from pytest_embedded_idf.utils import idf_parametrize -@pytest.mark.adc +@pytest.mark.generic @idf_parametrize('target', ['esp32'], indirect=['target']) def test_dac_cosine_wave_example_with_12bit_adc(dut: Dut) -> None: res = [] @@ -19,7 +19,7 @@ def test_dac_cosine_wave_example_with_12bit_adc(dut: Dut) -> None: assert max(chan0_val) - min(chan0_val) > 1000 -@pytest.mark.adc +@pytest.mark.generic @idf_parametrize('target', ['esp32s2'], indirect=['target']) def test_dac_cosine_wave_example_with_13bit_adc(dut: Dut) -> None: res = [] diff --git a/tools/ci/dynamic_pipelines/templates/known_generate_test_child_pipeline_warnings.yml b/tools/ci/dynamic_pipelines/templates/known_generate_test_child_pipeline_warnings.yml index 2beed67c7b9..afd606515c4 100644 --- a/tools/ci/dynamic_pipelines/templates/known_generate_test_child_pipeline_warnings.yml +++ b/tools/ci/dynamic_pipelines/templates/known_generate_test_child_pipeline_warnings.yml @@ -14,7 +14,6 @@ no_runner_tags: - esp32c2,jtag,xtal_40mhz - esp32c3,flash_multi - esp32c3,sdcard_sdmode - - esp32c5,adc - esp32c5,generic - esp32c5,jtag - esp32c5,ram_app @@ -28,7 +27,6 @@ no_runner_tags: - esp32c61,generic - esp32c61,jtag - esp32h2,jtag - - esp32p4,adc,esp32p4_eco4 - esp32p4,esp32p4_eco4,flash_encryption - esp32p4,esp32p4_eco4,lp_i2s - esp32p4,esp32p4_eco4,ram_app diff --git a/tools/ci/idf_pytest/constants.py b/tools/ci/idf_pytest/constants.py index 683428bf939..53e0a942ab8 100644 --- a/tools/ci/idf_pytest/constants.py +++ b/tools/ci/idf_pytest/constants.py @@ -96,7 +96,6 @@ ENV_MARKERS = { 'MSPI_F4R4': 'runner with Quad Flash and Quad PSRAM', 'jtag': 'runner where the chip is accessible through JTAG as well', 'usb_serial_jtag': 'runner where the chip is accessible through builtin JTAG as well', - 'adc': 'ADC related tests should run on adc runners', 'xtal32k': 'Runner with external 32k crystal connected', 'no32kXtal': 'Runner with no external 32k crystal connected', 'psramv0': 'Runner with PSRAM version 0',