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fix(ci): reduce peripheral multi dev test timeout time

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This commit is contained in:
wanckl
2026-08-19 15:30:55 +08:00
parent 124edb2243
commit 8889acc3d1
11 changed files with 14 additions and 14 deletions
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components/esp_driver_uart/test_apps/rs485/pytest_rs485.py
+1 -1
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@@ -17,4 +17,4 @@ from pytest_embedded_idf.utils import idf_parametrize
)
@idf_parametrize('target', ['esp32', 'esp32h2', 'esp32s3'], indirect=['target'])
def test_rs485_multi_dev(case_tester) -> None: # type: ignore
case_tester.run_all_multi_dev_cases(reset=True)
case_tester.run_all_multi_dev_cases(reset=True, timeout=60)
components/esp_driver_uart/test_apps/uart/pytest_uart.py
+1 -1
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@@ -140,4 +140,4 @@ def test_uart_single_dev_psram(case_tester) -> None: # type: ignore
def test_hp_uart_wakeup_modes(case_tester: CaseTester) -> None:
relevant_cases = [case for case in case_tester.test_menu if {'wakeup', 'uart'}.issubset(case.groups)]
for case in relevant_cases:
case_tester.run_multi_dev_case(case=case, reset=True)
case_tester.run_multi_dev_case(case=case, reset=True, timeout=30)