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feat(ble): add dtm test code to cert test example on ESP32-C6

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zwl
2025-06-13 11:45:28 +08:00
parent 46909c5048
commit 81b2bea2f7
8 changed files with 246 additions and 6 deletions
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examples/phy/cert_test/README.md
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(See the README.md file in the upper level 'examples' directory for more information about examples.)
This example shows how to use the Certification test APIS.
## How to use example
Before project configuration and build, be sure to set the correct chip target using `idf.py set-target <chip_name>`.
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For BLE test, if you want to use `fcc_le_tx` and `rw_le_rx_per` legacy commands for tx/rx test, you need to enable `ESP_PHY_LEGACY_COMMANDS` in menuconfig, otherwise, the new format commands `esp_ble_tx` and `esp_ble_rx` are supported.
## BLE DTM Test Function
The BLE DTM test function in this example currently supports only the ESP32-H2 and ESP32-C6 chips.
## Troubleshooting
For any technical queries, please open an [issue](https://github.com/espressif/esp-idf/issues) on GitHub. We will get back to you soon.