ci(adc): remove ADC runner and move ADC tests to generic

This commit is contained in:
gaoxu
2026-06-23 16:33:55 +08:00
parent 43cc865e97
commit 80254568a6
9 changed files with 13 additions and 16 deletions
@@ -28,7 +28,7 @@
#elif CONFIG_IDF_TARGET_ESP32S2
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 35
#define ADC_TEST_LOW_THRESH 40
#define ADC_TEST_HIGH_VAL 8191
#define ADC_TEST_HIGH_THRESH 10
@@ -49,7 +49,7 @@
#elif CONFIG_IDF_TARGET_ESP32C2
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 15
#define ADC_TEST_LOW_THRESH 30
#define ADC_TEST_HIGH_VAL 3400
#define ADC_TEST_HIGH_THRESH 200
@@ -5,7 +5,7 @@ from pytest_embedded import Dut
from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.adc
@pytest.mark.generic
@pytest.mark.parametrize(
'config',
[
@@ -22,7 +22,7 @@ def test_legacy_adc(dut: Dut) -> None:
dut.run_all_single_board_cases()
@pytest.mark.adc
@pytest.mark.generic
@pytest.mark.xtal_26mhz
@pytest.mark.parametrize(
'config, baud',
@@ -42,7 +42,7 @@ extern "C" {
#elif CONFIG_IDF_TARGET_ESP32S2
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 35
#define ADC_TEST_LOW_THRESH 80
#define ADC_TEST_HIGH_VAL 8191
#define ADC_TEST_HIGH_VAL_DMA 4095
@@ -66,7 +66,7 @@ extern "C" {
#elif CONFIG_IDF_TARGET_ESP32C2
#define ADC_TEST_LOW_VAL 0
#define ADC_TEST_LOW_THRESH 15
#define ADC_TEST_LOW_THRESH 30
#define ADC_TEST_HIGH_VAL 3400
#define ADC_TEST_HIGH_THRESH 200
@@ -5,7 +5,7 @@ from pytest_embedded import Dut
from pytest_embedded_idf.utils import idf_parametrize
@pytest.mark.adc
@pytest.mark.generic
@pytest.mark.parametrize('config', ['iram_safe', 'release', 'pm_enable'], indirect=True)
@idf_parametrize(
'target',
@@ -17,7 +17,7 @@ def test_adc(dut: Dut) -> None:
# No PM test, as C2 doesn't support ADC continuous mode
@pytest.mark.adc
@pytest.mark.generic
@pytest.mark.xtal_26mhz
@pytest.mark.parametrize(
'config, baud',