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change: fix build clang test apps job error

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This commit is contained in:
Li Shuai
2025-04-17 22:01:10 +08:00
parent b7e26d5546
commit 77a1e2931d
6 changed files with 42 additions and 26 deletions
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components/esp_hw_support/esp_clk.c
+7 -1
View File
@@ -26,6 +26,12 @@
#define MHZ (1000000)
#if CONFIG_PM_SLP_IRAM_OPT
# define ESP_CLK_FN_ATTR IRAM_ATTR
#else
# define ESP_CLK_FN_ATTR
#endif
// g_ticks_us defined in ROMs for PRO and APP CPU
extern uint32_t g_ticks_per_us_pro;
@@ -48,7 +54,7 @@ _Static_assert(offsetof(retain_mem_t, checksum) == sizeof(retain_mem_t) - sizeof
#if !NON_OS_BUILD
static __attribute__((section(".rtc_timer_data_in_rtc_mem"))) retain_mem_t s_rtc_timer_retain_mem;
static uint32_t calc_checksum(void)
static ESP_CLK_FN_ATTR uint32_t calc_checksum(void)
{
uint32_t checksum = 0;
uint32_t *data = (uint32_t*) &s_rtc_timer_retain_mem;
components/esp_hw_support/sar_periph_ctrl_common.c
+7 -1
View File
@@ -33,6 +33,12 @@ static const char *TAG_TSENS = "temperature_sensor";
#define TSENS_RCC_ATOMIC()
#endif
#if CONFIG_PM_SLP_IRAM_OPT
# define SAR_PERIPH_CTRL_COMMON_FN_ATTR IRAM_ATTR
#else
# define SAR_PERIPH_CTRL_COMMON_FN_ATTR
#endif
static int s_record_min = INT_NOT_USED;
static int s_record_max = INT_NOT_USED;
static int s_temperature_sensor_power_cnt;
@@ -79,7 +85,7 @@ void temperature_sensor_power_release(void)
portEXIT_CRITICAL(&rtc_spinlock);
}
static int temperature_sensor_get_raw_value(void)
static SAR_PERIPH_CTRL_COMMON_FN_ATTR int temperature_sensor_get_raw_value(void)
{
int raw_value = temperature_sensor_ll_get_raw_value();
return (TEMPERATURE_SENSOR_LL_ADC_FACTOR * raw_value - TEMPERATURE_SENSOR_LL_DAC_FACTOR * temperature_sensor_attributes[s_tsens_idx].offset - TEMPERATURE_SENSOR_LL_OFFSET_FACTOR);