From ffeb869509004d8ef3e65cc8f03790a575d72508 Mon Sep 17 00:00:00 2001 From: Chen Chen Date: Mon, 9 Mar 2026 10:13:38 +0800 Subject: [PATCH] ci(i2c): ignore known failure test case for legacy i2c driver --- .../test_apps/i2c_test_apps/main/test_i2c_multi.c | 6 ++++-- 1 file changed, 4 insertions(+), 2 deletions(-) diff --git a/components/esp_driver_i2c/test_apps/i2c_test_apps/main/test_i2c_multi.c b/components/esp_driver_i2c/test_apps/i2c_test_apps/main/test_i2c_multi.c index 9cdfe617ebc..2bdd911f536 100644 --- a/components/esp_driver_i2c/test_apps/i2c_test_apps/main/test_i2c_multi.c +++ b/components/esp_driver_i2c/test_apps/i2c_test_apps/main/test_i2c_multi.c @@ -220,7 +220,8 @@ static void i2c_slave_read_test_large_write_small_read(void) TEST_ESP_OK(i2c_del_slave_device(slave_handle)); } -TEST_CASE_MULTIPLE_DEVICES("I2C master write slave test (large write small read)", "[i2c][test_env=generic_multi_device][timeout=150]", i2c_master_write_test_large_write_small_read, i2c_slave_read_test_large_write_small_read); +// Ignored because the slave driver v1 API (`i2c_slave_receive`) is mis-designed. Redesigned in v5.4. +TEST_CASE_MULTIPLE_DEVICES("I2C master write slave test (large write small read)", "[i2c][ignore][test_env=generic_multi_device][timeout=150]", i2c_master_write_test_large_write_small_read, i2c_slave_read_test_large_write_small_read); static void master_read_slave_test(void) { @@ -782,7 +783,8 @@ static void uart_test_i2c_master_freq(void) } } -TEST_CASE_MULTIPLE_DEVICES("I2C master clock frequency test", "[i2c][test_env=generic_multi_device][timeout=150]", uart_test_i2c_master_freq, i2c_master_write_fsm_reset); +// This test fails on v5.3 due to the I2C legacy driver bug. Fixed since v5.4. +TEST_CASE_MULTIPLE_DEVICES("I2C master clock frequency test", "[i2c][ignore][test_env=generic_multi_device][timeout=150]", uart_test_i2c_master_freq, i2c_master_write_fsm_reset); #endif // CONFIG_IDF_TARGET_ESP32C3 || CONFIG_IDF_TARGET_ESP32S3